Contact Probes
Recent growth of these semiconductor packages, there are various requirements to improve on contacting to small devices.
A photo of the sample usage after insertion into a pin board.
Using our own fine pitch vertical contact probes makes it possible for full matrix pin alignment and this technology realize kelvin contact for QFN, WL-CSP and BGA. Our vertical contact probes are suitable for area-array layout kelvin contacting. For more information, please contact at info@seiken.co.jp.
We offer a wide variety of contact probes and receptacles on pitches ranging from 0.45mm to 2.54mm. Plunger tip styles can be provided in a variety of tip styles for our standard type contact probes. Receptacles are available with preassembled cable length 100mm or 300mm as option.Should you have any question or need more information, please contact at info@seiken.co.jp.
Please click on your desired catalog for the following.
Custom-made contact probes are also available to meet your specifications and for more information, please contact at info@seiken.co.jp.
Head Office
10F, Techno-Port Taiju Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)
Telephone reception service:
9:00-18:30(weekday)