Rare metal(minor metal) joining technology

By using our unique technologies, we have developed new type of a contact probe with its contact point a rare metal. We are expanding to rare metals besides rhodium and iridium, tungsten and palladium allowing for testing probe configuration.

Metal plating is not used for rare metal probes and so there are no problems with abrasion or peeling accordingly.

Vickers hardness of Rhodium and Iridium is much higher than that of standard material and therefore rare metal probes provide a longer life cycle. Moreover these rare metal have good electrical characteristics and have stable contact performance with QFN hard surface electrode. For more information, please contact at info@seiken.co.jp.

• Contact Probes
• Standard type contact probes
• Double plunger Contact Probes
• CNT(Carbon Nano Tube) Technology
• Non-magnetic technology
• Rare metal(minor metal) joining technology
• Kelvin technology
• Fine pitch technology
• Bias technology
• Lead-free technology
• High heat resistance technology