• Measuring the Future
    Unlocking the World

  • Nagano-Born Probes
    End-to-end Japanese Quality

  • Over 40 Years of
    Micron-Level Trust

  • Beyond Imagination
    +α Innovation in Solutions

At Seiken, we specialize in delivering high-precision test fixtures
that power the world’s most demanding electronic-testing environments.
From contact probes to probe cards, IC sockets and full fixture solutions,
we offer everything you need—custom-engineered, expertly manufactured,
and ready to perform.
Drawing on a broad spectrum of materials,
tip geometries, pitches, and advanced features—including high-current capability,
non-magnetic designs, Kelvin sensing, ultra-fine pitches, and more—
we tailor every solution to your unique specifications and timeline.

Our Core Products

  • Contact Probes

  • Advanced
    Probe Cards

  • IC Sockets

  • Test Fixtures

Contact Probes

Single- and double-ended probes engineered to boost accuracy in semiconductor and electronic-component testing. Options include high-current, non-magnetic materials, and more—fully customizable.

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Advanced Probe Cards

Unlock freedom in pin layout and benefit from easy maintenance for efficient front-end wafer testing —ideal for high-mix, low-volume production environments.

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IC Sockets

Socket solutions optimized for performance inspection at the package level. We tailor each design to match your test setup, enhancing your process.

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Test Fixtures

From sketch to assembly, we deliver turnkey test fixtures built for today’s fast-evolving electronics landscape. Your vision becomes our mission.

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Applications Across Industries

Seiken’s solutions support a wide range of applications—from semiconductors and PCBs to electronic components, automotive systems and medical equipment. We also welcome early-stage development and R&D projects.

FAQ

What is a contact probe?

A contact probe is a component normally used to test the electrical conductivity of electronic devices such as semiconductors, circuit boards, and more. It typically consists of three parts: a plunger (tip), a barrel (housing), and a spring (to control contact pressure). When properly matched to the application, it ensures stable, accurate signal transmission during testing.

How do I select the right probe for my application?

Choosing the ideal probe depends on n several factors, inlcuding your device under test—whether it’s a semiconductor, PCB, or IC—as well as factors such as terminal size and pitch, durability requirements, heat resistance, and spring force. Our team is available to help you identify the best probe for your specific conditions and testing environment.

Can custom-designed probes be mass-produced?

Absolutely. Once the prototype is evaluated and approved, we can move into full-scale production. Reach out to us to discuss your specific requirements.

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