Semiconductor
Non-magnetic probe cards require non-magnetic terminals and designed with non-magnetic materials. Our non-magnetic probe cards are the industry-leading probe card and we provide the prove card using non-magnetic contact probes for sensor device test applications.
B-H curve is shown as above figures and lower figure shows B-H curve of our non-magnetic probe.
We also provide the option to change the probe card to an IC test socket and supporting chip size of 1mm square or less. Our complete line of services covers not only the probe card but also supplying relay boards and wiring services.
For more information, please contact at info@seiken.co.jp
Head Office
10F, Techno-Port Taiju Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)