Semiconductor
We offer probe cards which use our vertical contact probes in WL-CSP testing. Advanced types have no limits in pin assignment and this allows for testing several chips at same time and products with large number of pins when conducting wafer test.
We apply our know-how as a test socket and probe card manufacturer to meet the diversified need of our customers. For more information, please contact at info@seiken.co.jp
Head Office
10F, Techno-Port Taiju Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)