Our Kelvin contact probe cards are suitable for area-array layout kelvin contacting to keep stable contact to micro bump and pad.
We provide two types of vertical contact Kelvin probe. One is a super-fine probe for Kelvin measurement to test WL-CSP with a pitch 0.3mm and the other is a new type of Kelvin probe for a pitch 0.4mm.
The super-fine pitch kelvin probe places importance on contact with a narrow pitch and the new type kelvin probe involves a design for the pin filling in the gap between 2 pins with our unique technologies. For more information, please contact at info@seiken.co.jp
