SEIKEN has been developing the following technologies.
This product is a custom designed test block consisting of spring contact probes and plastic blocks with pin holes. We offer a broad variety of different custom services to meet your requirements for component size, electrode and applications. We also offer support for mechanisms to set the testing components and wiring.
Probe pin blocksIn addition to Probe pin blocks, we offer manually operated press type inspection fixture which set the testing subject and adjust the height of the pin block to make contact.
Manually operated inspection fixturesThere are various different electronics components in today’s electronic society. In addition to TFT, OLED and semiconductors, there are numerous electronic components such as chip condenser (MLCC), connectors, circuit boards, batteries, sensors. There are also a wide variety of demands in sizes, configurations and testing for these electronic components.
Small parts like discrete semiconductor components and connectors require highly precise processing technologies while batteries require terminals which can handle large stable current. SEIKEN has built up a vast amount of testing experience for various different electronic components throughout our history of over 30 years. We hope that this technology can serve a significant purpose in testing for the user.
Head Office
10F, Techno-Port Taiju Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)